IConnect Tutorials

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IConnect Measurement Tutorials:
	True Impedance Profile (Z-line) Computation - This tutorial will guide you through the process for peeling the multiple reflections, and improving the impedance measurement accuracy and resolution of your TDR oscilloscope.
	S-parameter Computation - This tutorial explains how to generate differential and single-ended S-parameters, insertion loss, return loss and frequency domain crosstalk from your TDR oscilloscope measurements.
	Eye Diagram - This tutorial will show you how to generate an eye diagram for your interconnect from Time Domain Transmission (TDT) measurements. By using this capability, you can perform compliance testing and eye mask testing quickly and efficiently.
IConnect Modeling Tutorials:
	MeasureXtractor(TM) - This tutorial will show you how to use the automatic, exact, behavioral modeling technique in IConnect. This is an advanced technique which will automatically match your measurement data to a black-box model.
	Lossy Line Modeling - This tutorial will help you to create frequency dependent, lossy line models in IConnect. Skin effect and dielectric loss are characterized based on either transmission or open-far-end reflection. This works best for backplanes and cable assemblies.
	Single and Coupled Line Modeling - This tutorial explains how to create partition-based models which predict reflections, ringing and crosstalk. This modeling technique works best for relatively short interconnects (connectors, packages) and must be complemented with lossy line for backplanes and cable assemblies.
	Lumped LC Computation - This tutorial is based on JEDEC standard-based computation for self and mutual L and C. It is applicable for electrically short interconnects, such as short connectors, packages, sockets and vias.
IConnect Failure Analysis Tutorial:
	Failure Analysis Tutorial - This tutorial explains how to use IConnect and the true impedance profile (Z-line) to get the best results for your fault isolation and failure analysis needs.

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